Failure Summary
State failure mode, source, customer or lot reference, symptom, quantity affected, and urgency.
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Free Semiconductor & Electronics Template
Download a free failure analysis report template in Word, PDF, or Markdown. Or turn any video into failure analysis report template with Docsie AI — auto-fills every required field.
Use this template to document electrical, physical, and root cause analysis for failed devices or assemblies.
| Field | Details |
|---|---|
| Category | Semiconductor & Electronics |
| Owner | [Team or owner] |
| Version | [Version number] |
| Effective Date | [Date] |
| Review Cycle | [Monthly / Quarterly / Annual / Event-based] |
| Status | [Draft / In Review / Approved] |
State failure mode, source, customer or lot reference, symptom, quantity affected, and urgency.
| Item | Details | Owner | Status |
|---|---|---|---|
| [Item or requirement] | [Describe the relevant detail, evidence, or decision] | [Owner] | [Open / Complete] |
| [Item or requirement] | [Describe the relevant detail, evidence, or decision] | [Owner] | [Open / Complete] |
[Add context, assumptions, exceptions, evidence links, screenshots, calculations, or reviewer comments.]
List device, package, date code, lot, serial numbers, handling condition, and chain of custody.
| Item | Details | Owner | Status |
|---|---|---|---|
| [Item or requirement] | [Describe the relevant detail, evidence, or decision] | [Owner] | [Open / Complete] |
| [Item or requirement] | [Describe the relevant detail, evidence, or decision] | [Owner] | [Open / Complete] |
[Add context, assumptions, exceptions, evidence links, screenshots, calculations, or reviewer comments.]
Summarize curve trace, ATE retest, bench measurement, thermal, or X-ray screening results.
| Item | Details | Owner | Status |
|---|---|---|---|
| [Item or requirement] | [Describe the relevant detail, evidence, or decision] | [Owner] | [Open / Complete] |
| [Item or requirement] | [Describe the relevant detail, evidence, or decision] | [Owner] | [Open / Complete] |
[Add context, assumptions, exceptions, evidence links, screenshots, calculations, or reviewer comments.]
Document decapsulation, cross-section, SEM/EDS, acoustic microscopy, dye-and-pry, or microscopy evidence.
| Item | Details | Owner | Status |
|---|---|---|---|
| [Item or requirement] | [Describe the relevant detail, evidence, or decision] | [Owner] | [Open / Complete] |
| [Item or requirement] | [Describe the relevant detail, evidence, or decision] | [Owner] | [Open / Complete] |
[Add context, assumptions, exceptions, evidence links, screenshots, calculations, or reviewer comments.]
Link the confirmed or most probable cause to evidence and reject unsupported hypotheses.
| Item | Details | Owner | Status |
|---|---|---|---|
| [Item or requirement] | [Describe the relevant detail, evidence, or decision] | [Owner] | [Open / Complete] |
| [Item or requirement] | [Describe the relevant detail, evidence, or decision] | [Owner] | [Open / Complete] |
[Add context, assumptions, exceptions, evidence links, screenshots, calculations, or reviewer comments.]
Assign containment, process correction, design update, supplier action, and verification owners.
| Item | Details | Owner | Status |
|---|---|---|---|
| [Item or requirement] | [Describe the relevant detail, evidence, or decision] | [Owner] | [Open / Complete] |
| [Item or requirement] | [Describe the relevant detail, evidence, or decision] | [Owner] | [Open / Complete] |
[Add context, assumptions, exceptions, evidence links, screenshots, calculations, or reviewer comments.]
State return, scrap, rework, customer response, and retained evidence location. Keep the report factual, concise, and traceable to tested evidence.
| Item | Details | Owner | Status |
|---|---|---|---|
| [Item or requirement] | [Describe the relevant detail, evidence, or decision] | [Owner] | [Open / Complete] |
| [Item or requirement] | [Describe the relevant detail, evidence, or decision] | [Owner] | [Open / Complete] |
[Add context, assumptions, exceptions, evidence links, screenshots, calculations, or reviewer comments.]
Document review conclusions, approvals, unresolved items, and next review date.
| Role | Name | Date | Notes |
|---|---|---|---|
| Preparer | [Name] | [Date] | [Notes] |
| Reviewer | [Name] | [Date] | [Notes] |
| Approver | [Name] | [Date] | [Notes] |
Deploy this template when semiconductor or electronics components fail during testing, manufacturing, or field operation and require documented root cause analysis.
This template produces a complete failure analysis report linking physical evidence to root cause with assigned corrective actions.
Most failure reports fail by speculating without evidence, omitting traceability, or skipping verification of corrective actions.
Template Structure
Use this semiconductor & electronics template as a starting point, then customize each section to match your internal workflow, evidence, and signoff needs.
State failure mode, source, customer or lot reference, symptom, quantity affected, and urgency.
List device, package, date code, lot, serial numbers, handling condition, and chain of custody.
Summarize curve trace, ATE retest, bench measurement, thermal, or X-ray screening results.
Document decapsulation, cross-section, SEM/EDS, acoustic microscopy, dye-and-pry, or microscopy evidence.
Link the confirmed or most probable cause to evidence and reject unsupported hypotheses.
Assign containment, process correction, design update, supplier action, and verification owners.
State return, scrap, rework, customer response, and retained evidence location. Keep the report factual, concise, and traceable to tested evidence.
Write a semiconductor/electronics failure analysis report. Structure with these Markdown sections:
State failure mode, source, customer or lot reference, symptom, quantity affected, and urgency.
List device, package, date code, lot, serial numbers, handling condition, and chain of custody.
Summarize curve trace, ATE retest, bench measurement, thermal, or X-ray screening results.
Document decapsulation, cross-section, SEM/EDS, acoustic microscopy, dye-and-pry, or microscopy evidence.
Link the confirmed or most probable cause to evidence and reject unsupported hypotheses.
Assign containment, process correction, design update, supplier action, and verification owners.
State return, scrap, rework, customer response, and retained evidence location.
Keep the report factual, concise, and traceable to tested evidence.
Symptom: No high-side output on customer board return RMA-4219.
Quantity: 2 failed units from date code 2614A.
ATE retest confirmed leakage on HO pin above 2 mA at 12 V. Curve trace showed low impedance to VS.
Decapsulation found EOS damage near the HO bond pad. SEM showed localized metal melt with no bond lift.
Probable electrical overstress during board-level inductive load switching. No fab defect evidence was found.
Retain Unit 2 cross-section samples in FA cabinet shelf B for customer review.
Already have a walkthrough or training video covering this process? Skip manual drafting. Upload the video and Docsie AI generates failure analysis report template with every required field populated — ready for review, signoff, or export.
Use the template manually, or let Docsie generate the first draft from source footage.
Track die attach, wire bond, mold, singulation, inspection, and release steps for IC assembly
Define device burn-in loading, stress conditions, monitoring, unload, and disposition
Define gowning, behavior, and contamination controls for [cleanroom area]
Create a concise semiconductor device datasheet with ratings, electrical characteristics, timing, and package data
Define electrostatic discharge controls for [electronics line/lab/fab area]
Control semiconductor or electronics product, process, test, material, or documentation changes
Template FAQ
Common questions about downloading and generating a failure analysis report template.
Q: What is a failure analysis report template?
A: A failure analysis report template is a structured document for document electrical, physical, and root cause analysis for failed devices or assemblies.
Q: Is the failure analysis report template really free?
A: Yes. The failure analysis report template is completely free to download in Word (DOCX), PDF, and Markdown formats. No signup or credit card required to download.
Q: How do I turn a video into a failure Analysis Report?
A: Upload a process walkthrough, training recording, or screen capture to Docsie. The AI analyzes the video and generates a complete failure Analysis Report using this template's structure — every required field auto-filled from the footage.
Q: Can I edit the failure analysis report template after downloading?
A: Yes. The DOCX format opens in Microsoft Word or Google Docs. The Markdown format imports into Notion, Confluence, Docsie, or any markdown editor. Customize fields, add your branding, and adapt to your internal workflow.