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Free Wafer Sort Procedure Template

Download a free wafer sort procedure template in Word, PDF, or Markdown. Or turn any video into wafer sort procedure template with Docsie AI — auto-fills every required field.

Scope Equipment Setup Probe Card Checks Sort Execution Binning Rules Data Handling Hold Criteria

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Wafer Sort Procedure

Use this template to define probe setup, wafer sort execution, binning, data handling, and hold criteria.

Template Metadata

Field	Details
Category	Semiconductor & Electronics
Owner	[Team or owner]
Version	[Version number]
Effective Date	[Date]
Review Cycle	[Monthly / Quarterly / Annual / Event-based]
Status	[Draft / In Review / Approved]

Scope

Identify device, wafer technology, sort insertion, test program, and applicable lot types.

Item	Details	Owner	Status
[Item or requirement]	[Describe the relevant detail, evidence, or decision]	[Owner]	[Open / Complete]
[Item or requirement]	[Describe the relevant detail, evidence, or decision]	[Owner]	[Open / Complete]

Notes

[Add context, assumptions, exceptions, evidence links, screenshots, calculations, or reviewer comments.]

Equipment Setup

List prober, tester, load board, probe card, chuck temperature, and required calibrations.

Item	Details	Owner	Status
[Item or requirement]	[Describe the relevant detail, evidence, or decision]	[Owner]	[Open / Complete]
[Item or requirement]	[Describe the relevant detail, evidence, or decision]	[Owner]	[Open / Complete]

Notes

[Add context, assumptions, exceptions, evidence links, screenshots, calculations, or reviewer comments.]

Probe Card Checks

Define cleaning, alignment, contact resistance, touchdown limits, and maintenance triggers.

Item	Details	Owner	Status
[Item or requirement]	[Describe the relevant detail, evidence, or decision]	[Owner]	[Open / Complete]
[Item or requirement]	[Describe the relevant detail, evidence, or decision]	[Owner]	[Open / Complete]

Notes

[Add context, assumptions, exceptions, evidence links, screenshots, calculations, or reviewer comments.]

Sort Execution

Provide step-by-step lot load, wafer map verification, first wafer review, and production flow.

Item	Details	Owner	Status
[Item or requirement]	[Describe the relevant detail, evidence, or decision]	[Owner]	[Open / Complete]
[Item or requirement]	[Describe the relevant detail, evidence, or decision]	[Owner]	[Open / Complete]

Notes

[Add context, assumptions, exceptions, evidence links, screenshots, calculations, or reviewer comments.]

Binning Rules

Describe pass bins, fail bins, retest bins, inkless map rules, and engineering bins.

Item	Details	Owner	Status
[Item or requirement]	[Describe the relevant detail, evidence, or decision]	[Owner]	[Open / Complete]
[Item or requirement]	[Describe the relevant detail, evidence, or decision]	[Owner]	[Open / Complete]

Notes

[Add context, assumptions, exceptions, evidence links, screenshots, calculations, or reviewer comments.]

Data Handling

Specify STDF, wafer map, MES upload, backup, and customer data package requirements.

Item	Details	Owner	Status
[Item or requirement]	[Describe the relevant detail, evidence, or decision]	[Owner]	[Open / Complete]
[Item or requirement]	[Describe the relevant detail, evidence, or decision]	[Owner]	[Open / Complete]

Notes

[Add context, assumptions, exceptions, evidence links, screenshots, calculations, or reviewer comments.]

Hold Criteria

List yield, continuity, probe mark, temperature, and equipment alarms requiring lot hold. Use probe and ATE terminology with auditable setup values.

Item	Details	Owner	Status
[Item or requirement]	[Describe the relevant detail, evidence, or decision]	[Owner]	[Open / Complete]
[Item or requirement]	[Describe the relevant detail, evidence, or decision]	[Owner]	[Open / Complete]

Notes

[Add context, assumptions, exceptions, evidence links, screenshots, calculations, or reviewer comments.]

Review and Signoff

Document review conclusions, approvals, unresolved items, and next review date.

Role	Name	Date	Notes
Preparer	[Name]	[Date]	[Notes]
Reviewer	[Name]	[Date]	[Notes]
Approver	[Name]	[Date]	[Notes]

Template Guide

How to Use the Wafer Sort Procedure Template

When to Use This Template

Deploy this template when qualifying new products, transferring test programs, or establishing production wafer sort operations.

New product introduction requiring wafer-level electrical parametric testing
Semiconductor foundry or OSAT establishing certified probe test flows
ISO 9001 or IATF 16949 audits requiring documented sort procedures

What This Template Covers

This template produces a complete, auditable wafer sort procedure from equipment setup through data delivery.

Prober configuration with chuck temperature, probe card specs, and calibration intervals
Binning logic defining pass/fail/retest categories with inkless wafer map rules
STDF file generation, MES upload protocols, and customer data package requirements

Common Pitfalls to Avoid

Most wafer sort procedures fail by omitting critical equipment parameters or ambiguous yield hold triggers.

Missing probe card maintenance triggers causes incomplete contact and yield loss
Vague binning rules create customer rejects due to inconsistent wafer maps
Undefined hold criteria delays engineering response when equipment drifts out-of-spec

Template Structure

What the Wafer Sort Procedure Template Includes

Use this semiconductor & electronics template as a starting point, then customize each section to match your internal workflow, evidence, and signoff needs.

1

Scope

Identify device, wafer technology, sort insertion, test program, and applicable lot types.

2

Equipment Setup

List prober, tester, load board, probe card, chuck temperature, and required calibrations.

3

Probe Card Checks

Define cleaning, alignment, contact resistance, touchdown limits, and maintenance triggers.

4

Sort Execution

Provide step-by-step lot load, wafer map verification, first wafer review, and production flow.

5

Binning Rules

Describe pass bins, fail bins, retest bins, inkless map rules, and engineering bins.

6

Data Handling

Specify STDF, wafer map, MES upload, backup, and customer data package requirements.

7

Hold Criteria

List yield, continuity, probe mark, temperature, and equipment alarms requiring lot hold. Use probe and ATE terminology with auditable setup values.

Recommended Structure

Write a wafer sort procedure. Structure with these Markdown sections:

Scope

Identify device, wafer technology, sort insertion, test program, and applicable lot types.

Equipment Setup

List prober, tester, load board, probe card, chuck temperature, and required calibrations.

Probe Card Checks

Define cleaning, alignment, contact resistance, touchdown limits, and maintenance triggers.

Sort Execution

Provide step-by-step lot load, wafer map verification, first wafer review, and production flow.

Binning Rules

Describe pass bins, fail bins, retest bins, inkless map rules, and engineering bins.

Data Handling

Specify STDF, wafer map, MES upload, backup, and customer data package requirements.

Hold Criteria

List yield, continuity, probe mark, temperature, and equipment alarms requiring lot hold.

Use probe and ATE terminology with auditable setup values.

Example Filled Template

Wafer Sort Procedure - RF Switch RS21

Equipment Setup

Tester: V93000
Prober: P12 with 25 C chuck
Probe Card: PC-RS21-04, max 80k touchdowns

Probe Card Checks

Clean after every wafer or when contact resistance exceeds 1.5 ohm on any power pin.

Sort Execution

Verify wafer ID against MES lot traveler.
Load wafer map and confirm flat orientation.
Run first wafer and pause for product engineer yield review.

Hold Criteria

Hold lot if continuity failures exceed 2 percent or site-to-site yield delta exceeds 5 percent.

Video to Document

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Template FAQ

Wafer Sort Procedure Template FAQ

Common questions about downloading and generating a wafer sort procedure template.

Using This Template

Q: What is a wafer sort procedure template?

A: A wafer sort procedure template is a structured document for define probe setup, wafer sort execution, binning, data handling, and hold criteria.

Q: Is the wafer sort procedure template really free?

A: Yes. The wafer sort procedure template is completely free to download in Word (DOCX), PDF, and Markdown formats. No signup or credit card required to download.

Q: How do I turn a video into a wafer Sort Procedure?

A: Upload a process walkthrough, training recording, or screen capture to Docsie. The AI analyzes the video and generates a complete wafer Sort Procedure using this template's structure — every required field auto-filled from the footage.

Q: Can I edit the wafer sort procedure template after downloading?

A: Yes. The DOCX format opens in Microsoft Word or Google Docs. The Markdown format imports into Notion, Confluence, Docsie, or any markdown editor. Customize fields, add your branding, and adapt to your internal workflow.